Spin-polarized scanning tunneling microscopy and spectroscopy study of c(2x2) reconstructed Cr(001) thin film surfaces

摘要

Spin dependent electronic properties of c(2x2) Cr(001) thin film surfaces grown on MgO(001) substrates are investigated by means of spin-polarized scanning tunneling microscopy and spectroscopy. An averaged dI/dV spectrum obtained on the c(2x2) Cr(001) thin film surfaces exhibits a surface state around +0.1 eV above the Fermi level. The intensity of the surface state peak in the spectra measured on (001) terraces is alternately varied whenever a monatomic step is crossed. Therefore, the shifted surface state as well as an original one on (1x1) Cr(001) surfaces has spin-polarized feature. (C) 2006 American Institute of Physics.